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A Comprehensive Survey on Edge Data Integrity Verification: Fundamentals and Future Trends.

Authors :
Zhao, Yao
Qu, Youyang
Xiang, Yong
Uddin, Md Palash
Peng, Dezhong
Gao, Longxiang
Source :
ACM Computing Surveys. Jan2025, Vol. 57 Issue 1, p1-34. 34p.
Publication Year :
2025

Details

Language :
English
ISSN :
03600300
Volume :
57
Issue :
1
Database :
Academic Search Index
Journal :
ACM Computing Surveys
Publication Type :
Academic Journal
Accession number :
180903226
Full Text :
https://doi.org/10.1145/3680277