YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards.

MLA

Yunpeng, Gao, et al. “YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards.” Journal of Electronic Testing, vol. 40, no. 5, Oct. 2024, pp. 645–56. EBSCOhost, https://doi.org/10.1007/s10836-024-06146-2.

APA

Yunpeng, G., Rui, Z., Mingxu, Y., & Sabah, F. (2024). YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards. Journal of Electronic Testing, 40(5), 645–656. https://doi.org/10.1007/s10836-024-06146-2

Chicago

Yunpeng, Gao, Zhang Rui, Yang Mingxu, and Fahad Sabah. 2024. “YOLOv8-TDD: An Optimized YOLOv8 Algorithm for Targeted Defect Detection in Printed Circuit Boards.” Journal of Electronic Testing 40 (5): 645–56. doi:10.1007/s10836-024-06146-2.