STRUCTURAL, DIELECTRIC AND MAGNETIC PROPERTIES OF EPITAXIAL GROWN YMn0.5Cr0.5O3 THIN FILMS.

YCr(1-x)MnxO3 is an intriguing member of the perovskite family, attracting significant interest due to its versatile properties and potential applications in various fields. Epitaxial orthorhombic YMn0.5Cr0.5O3 films are grown on STO substrates by pulsed laser deposition method. Well crystalline with (0 ℓ 0) orientation of YMn0.5Cr0.5O3 films are identified by X-ray diffraction. Field emission scanning electron microscopy used to capture the morphological behavior of crystalline YMn0.5Cr0.5O3 films. Temperature dependent dielectric properties are analyzed thoroughly. The magnetic properties of YMn0.5Cr0.5O3 films are characterized using physical property measurement system. There is a clear magnetic transition observed around 60K for three YMn0.5Cr0.5O3 films. Films deposited at 600oC exhibited high dielectric and magnetic properties. [ABSTRACT FROM AUTHOR]