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Mapping the electric field of high-definition transcranial electrical stimulation across the lifespan.

Authors :
Ma, Weiwei
Wang, Feixue
Yi, Yangyang
Huang, Yu
Li, Xinying
Liu, Ya'ou
Tu, Yiheng
Source :
Science Bulletin. Dec2024, Vol. 69 Issue 24, p3876-3888. 13p.
Publication Year :
2024

Abstract

[Display omitted] Transcranial electrical stimulation (tES) is a non-invasive technique widely used in modulating brain activity and behavior, but its effects differ across individuals and are influenced by head anatomy. In this study, we investigated how the electric field (EF) generated by high-definition tES varies across the lifespan among different demographic groups and its relationship with neural responses measured by functional magnetic resonance imaging (fMRI). We employed an MRI-guided finite element method to simulate the EF for the two most common tES montages (i.e., targeting the dorsolateral prefrontal cortex and motor cortex, respectively) in two large cohorts of white and Asian participants aged 12 to 100 years. We found that the EF intensity decreased with age, particularly in individuals under 25 years of age, and was influenced by gender and ethnicity. We identified skull thickness, scalp thickness, and epidural cerebrospinal fluid thickness, as the primary anatomical factors accounting for the inter-individual EF variability. Using a concurrent tES-fMRI approach, we observed a spatial consistency between the simulated EF and the brain activity changes induced by tES in the target region. Finally, we developed an open-source toolbox incorporating age-stratified head models to facilitate efficient EF calculations. These findings characterize and quantify the individual differences in tES-induced EF, offering a reference for implementing personalized neuromodulation strategies. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
20959273
Volume :
69
Issue :
24
Database :
Academic Search Index
Journal :
Science Bulletin
Publication Type :
Academic Journal
Accession number :
181773680
Full Text :
https://doi.org/10.1016/j.scib.2024.10.001