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dV/dt effect in high-voltage 4H-SiC thyristors.

Authors :
M E Levinshtein
P A Ivanov
T T Mnatsakanov
S N Yurkov
A K Agarwal and J W Palmour
Source :
Semiconductor Science & Technology. Aug2005, Vol. 20 Issue 8, p793-795. 3p.
Publication Year :
2005

Abstract

The switching of high-voltage (1.5 kV) 4H-SiC thyristors by the dV/dt effect has been investigated for the first time in the temperature range from 300 to 504 K. At a rise time of the forward bias V(t) equal to 30 ns, the characteristic bias at which the structure under investigation can be switched on by the dV/dt effect decreases steadily from 289 V at room temperature (dV/dt ~ 9.7 kV µs-1) to 137 V at T = 504 K. The characteristic value of the critical charge per unit area, Qcr, is ~1.9 × 10-7 C cm-2 at room temperature and also decreases steadily as the temperature increases. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
02681242
Volume :
20
Issue :
8
Database :
Academic Search Index
Journal :
Semiconductor Science & Technology
Publication Type :
Academic Journal
Accession number :
18246990
Full Text :
https://doi.org/10.1088/0268-1242/20/8/026