Comparison of conductivity functions for effective skin depth in electrodynamic structures with roughness.

A model for taking into account the rough surfaces of electrodynamic systems of microwave devices, based on averaging the profile along the metal–vacuum surface is discussed in this article. In this case, the skin effect layer is analytically determined for various characteristic profile types. Therefore, this can be used to calculate the parameters of vacuum electronic devices, in particular the Ohmic losses and quality factor of resonators. [ABSTRACT FROM AUTHOR]