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A Si/CdTe Semiconductor Compton Camera.

Authors :
Watanabe, Shin
Tanaka, Takaaki
Nakazáwa, Kazuhiro
Mitani, Takeumi
Oonuki, Kousuke
Takahashi, Tadayuki
Takashima, Takeshi
Tajima, Hiroyasu
Fukazawa, Yasushi
Nomachi, Masaharu
Kubo, Shin
Onishi, Mitsunobu
Kuroda, Yoshikatsu
Source :
IEEE Transactions on Nuclear Science. Oct2005 Part 3, Vol. 52 Issue 5, p2045-2051. 7p.
Publication Year :
2005

Abstract

We are developing a Compton camera based on Si and CdTe semiconductor imaging devices with high energy resolution. In this paper, results from the most recent prototype are re- ported. The Compton camera consists of six layered double-sided Si Strip detectors and CdTe pixel detectors, which are read out with low noise analog ASICs, VA32TAs. We obtained Compton reconstructed images and spectra of line gamma-rays from 122 keV to 662 keV. The energy resolution is 9.1 keV and 14 keV at 356 keV and 511 keV, respectively. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189499
Volume :
52
Issue :
5
Database :
Academic Search Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
19314502
Full Text :
https://doi.org/10.1109/TNS.2005.856995