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Electronic properties of H-terminated diamond in electrolyte solutions.

Authors :
Nebel, C. E.
Rezek, B.
Shin, D.
Watanabe, H.
Yamamoto, T.
Source :
Journal of Applied Physics. 2/1/2006, Vol. 99 Issue 3, p033711. 4p. 4 Diagrams, 3 Graphs.
Publication Year :
2006

Abstract

The electronic properties of hydrogen-terminated single-crystalline chemical-vapor deposited diamond in electrolyte solutions between pH 2 and 12 have been characterized by cyclic voltammetry experiments and pH-sensitive measurements using ion-sensitive field-effect transistor structures. The data show the formation of surface conductivity in diamond if immersed into electrolytes. The drain-source conductivity is pH dependent, with about 66 mV/pH. Due to strong Coulomb repulsion between positive ions in the electrolyte (hydronium ions) and the H+-surface termination of diamond, an enlarged tunneling gap is established which prevents electronic interactions between the electrolyte and diamond. This gap is the “virtual gate insulator” of diamond ion-sensitive field-effect transistor structures, with an interface resistance of about 108 Ω. The application of potentials larger than the oxidation threshold of +0.7 V (pH 13) to +1.6 V (pH 1) gives rise to strong leakage currents and to partial surface oxidation. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
3
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
19791240
Full Text :
https://doi.org/10.1063/1.2171805