An Automated and Efficient Substrate Noise Analysis Tool.

Authors :: Hongmei Li
Zemke, Cole E.
Manetas, Giorgos
Okhmatovski, Vladimir I.
Rosenbaum, Elyse
Cangellaris, Andreas C.
Source :: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. Mar2006, Vol. 25 Issue 3, p434-468. 15p. 5 Black and White Photographs, 16 Graphs.
Publication Year :: 2006
Abstract: This paper presents a methodology for the efficient modeling of substrate noise coupling. A closed-form Green's function for nonuniformly doped substrates is employed with the correct singular characteristics. A novel global surface impedance matrix scheme is introduced to efficiently model nonuniformly doped wells, channel stop implants, and buried layers. Layout, device, and netlist extractors are developed so as to integrate our boundary element method (BEM) solver with commercial layout and circuit simulation tools. [ABSTRACT FROM AUTHOR]

Subjects :: *COMPUTER circuits
*COMPUTER engineering
*SYSTEMS on a chip
*DIGITAL electronics
*SWITCHING circuits
*METAL oxide semiconductors

Language :: English
ISSN :: 02780070
Volume :: 25
Issue :: 3
Database :: Academic Search Index
Journal :: IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems
Publication Type :: Academic Journal
Accession number :: 20054636
Full Text :: https://doi.org/10.1109/TCAD.2005.854628