Characterization of three-dimensional crystallographic distributions using polychromatic X-ray microdiffraction

Abstract: Polychromatic microdiffraction uses small X-ray beams to characterize the local crystallographic structure of materials. When combined with a depth resolving technique called differential aperture microscopy, the phase and local orientation of femto-liter volumes (0.5×0.5×0.7μm3) can be resolved beneath the surface of a sample. In addition, the local elastic strain and dislocation tensors can also be determined and the local dislocation type can be modeled. Here we present recent technical developments, including example applications and emerging research directions. [Copyright &y& Elsevier]