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Effect of niobium on the structure of titanium dioxide thin films

Authors :
Sheppard, L.
Bak, T.
Nowotny, J.
Sorrell, C.C.
Kumar, S.
Gerson, A.R.
Barnes, M.C.
Ball, C.
Source :
Thin Solid Films. Jul2006, Vol. 510 Issue 1/2, p119-124. 6p.
Publication Year :
2006

Abstract

Abstract: This paper reports the effect of niobium on the structure of titanium dioxide (TiO2) thin films deposited on glass. The results obtained indicated that the direct current (DC) co-sputtering of Ti and Nb onto glass substrates in the presence of oxygen results in the formation of Nb-doped anatase thin films with strong preferential orientation. In the concentration range between 0 and 40 at.% Nb, niobium is incorporated into the TiO2 lattice according to a substitution mechanism, entering Ti sites in the cation sub-lattice. No evidence exists for a solubility limit <40 at.% of Nb under the applied deposition conditions, however, it is not believed that an equilibrium situation prevails. Lattice charge compensation was concluded to occur by the formation of cation vacancies for samples with up to 10 at.% Nb, and by Ti3+ or Nb4+ ions for the samples with ≥15 at.% Nb, the latter in conjunction with cation vacancy compensation. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00406090
Volume :
510
Issue :
1/2
Database :
Academic Search Index
Journal :
Thin Solid Films
Publication Type :
Academic Journal
Accession number :
20820985
Full Text :
https://doi.org/10.1016/j.tsf.2005.12.272