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Innovative Test Method for the Shielding Effectiveness Measurement of Conductive Thin Films in a Wide Frequency Range.
- Source :
-
IEEE Transactions on Electromagnetic Compatibility . May2006, Vol. 48 Issue 2, p331-341. 11p. 2 Black and White Photographs, 15 Diagrams, 5 Charts. - Publication Year :
- 2006
-
Abstract
- This paper presents an innovative test procedure for the prediction of the shielding effectiveness of small sample materials, consisting of a dielectric substrate coated with thin conducting film, in a wide frequency range up to 8 GHz. The proposed technique overcomes the limitations of the ASTM D4935 test method concerning the upper operating frequency and the required minimum specimen dimensions. A new high-order equivalent circuit model of the test fixture is developed. A correction factor is applied to the measured insertion loss to eliminate both the resonance peak below cutoff appearing in the high-frequency range and the low-frequency errors due to the weak capacitive coupling between the flanges of the coaxial cell. The accurate prediction of the shielding effectiveness of the test material against a plane wave is then derived from the insertion loss measurements. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00189375
- Volume :
- 48
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Electromagnetic Compatibility
- Publication Type :
- Academic Journal
- Accession number :
- 21100734
- Full Text :
- https://doi.org/10.1109/TEMC.2006.874664