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Magnetization reversal study in submicron half-ring patterned wires with different corner structures.

Authors :
Yu, C.
Chen, Y. S.
Yao, Y. D.
Cheng, K. W.
Lee, S. F.
Wu, K. T.
Liou, Y.
Source :
Journal of Applied Physics. 4/15/2006, Vol. 99 Issue 8, p08G309. 3p. 1 Black and White Photograph, 1 Diagram, 2 Graphs.
Publication Year :
2006

Abstract

Magnetization reversal phenomena in submicron half-ring patterned wires with different corner structures have been investigated. The wires with corner structures of rectangular, semicircle, and triangular shapes were connected in series by two or five half-rings. The variation of domain structures with magnetic field is illustrated by electron transport measurements, simulation, and magnetic force microscopy (MFM) images. The switching behavior depends on the corner structures connecting the half-ring structures. These results are consistent with the domain pattern and magnetic phase shift observation provided by the MFM measurements. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
99
Issue :
8
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
21125648
Full Text :
https://doi.org/10.1063/1.2173223