In situ x-ray diffraction study of the thermal expansion of the ordered arrays of silver nanowires embedded in anodic alumina membranes.

Thermal expansion of as-prepared and annealed ordered arrays of silver nanowires embedded in anodic alumina membranes (AAMs) was studied by in situ x-ray diffraction measurement in the temperature range from 25 to 800 °C. The axial thermal expansion coefficient (TEC) for the as-prepared nanowires is 6.35×10-9/°C and 6.02×10-6/°C below and above 650 °C, respectively. However, the TEC of the annealed sample turns from 2.32×10-6/°C to 12.06×10-6/°C when the temperature is above 350 °C. The collective effects of the intrinsic expansion, surface pressure, the limit effect of AAM, and the vacancies incorporated into the silver lattice were responsible for the thermal expansion. [ABSTRACT FROM AUTHOR]