Cite
Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction.
MLA
Sun, W. C., et al. “Measuring Interface Strains at the Atomic Resolution in Depth Using X-Ray Bragg-Surface Diffraction.” Applied Physics Letters, vol. 89, no. 9, Aug. 2006, p. 091915. EBSCOhost, https://doi.org/10.1063/1.2345023.
APA
Sun, W. C., Chang, H. C., Wu, B. K., Chen, Y. R., Chu, C. H., Chang, S. L., Hong, M., Tang, M. T., & Stetsko, Y. P. (2006). Measuring interface strains at the atomic resolution in depth using x-ray Bragg-surface diffraction. Applied Physics Letters, 89(9), 091915. https://doi.org/10.1063/1.2345023
Chicago
Sun, W. C., H. C. Chang, B. K. Wu, Y. R. Chen, C. H. Chu, S. L. Chang, M. Hong, M. T. Tang, and Yu. P. Stetsko. 2006. “Measuring Interface Strains at the Atomic Resolution in Depth Using X-Ray Bragg-Surface Diffraction.” Applied Physics Letters 89 (9): 091915. doi:10.1063/1.2345023.