High-Contrast Imaging of Nano-Channels Using Reflection Near-Field Scanning Optical Microscope Enhanced by Optical Interference.

The article discusses the high-contrast imaging of nano-channels using reflection near-field scanning optical microscope (NSOM) enhanced by optical interference. The researchers of the study have demonstrated a contrast enhancement in a near-field scanning optical microscope by optical interference with an aperture probe in reflection mode operation. The reflection NSOM was a promising instrument for high-resolution optical detection and estimation of low-contrast nanostructures.