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China ICs, tester raise prospects for TD-SCDMA.
- Source :
-
Electronic Engineering Times (01921541) . 10/23/2006, Issue 1446, p32-36. 2p. - Publication Year :
- 2006
-
Abstract
- The article reports that Shanghai, China-based Comlent Technology Inc.'s release of a single-chip transceiver integrated circuit and a Time Division Synchronous Code Division Multiple Access (TD-SCDMA) field tester eliminate roadblocks in the progress of third-generation (3G) wireless communication technology in China. TD-SCDMA support would be added to Tektronix Inc.'s NetTek Wireless RF Field Tester.
Details
- Language :
- English
- ISSN :
- 01921541
- Issue :
- 1446
- Database :
- Academic Search Index
- Journal :
- Electronic Engineering Times (01921541)
- Publication Type :
- Periodical
- Accession number :
- 22976304