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Rad-Hard Silicon Diode Response for Photon Spectrometry.

Authors :
Gonçalves;, J. A. C.
Camargo, F.
Fraga, M. M. R.
Pinto, J. K. C.
Bueno, C. C.
Source :
IEEE Transactions on Nuclear Science. Feb2007 Part 2 of 2, Vol. 54 Issue 1, p276-279. 4p. 2 Diagrams, 5 Graphs.
Publication Year :
2007

Abstract

In this Paper we describe the performance of a rad- hard diode (A1/p+/n/n+/Al), developed in the framework of research and development programs for the future CMS experiment at LHC, for detection and spectrometry of X-and -γ-rays envis-aging its use in characterization of porous structures by X-ray tomography. The diode's response was studied using 57 Co, 133 and 241Am radioactive sources at room temperature. A reasonable good energy resolution was obtained in the energy range between 30 and 360 keV (FWHM = 5.2 keV and 5.7 keV, respectively). In the same energy range, measurements of full-energy peak efficien- cies were carried out and compared with the theoretical values. For 59.5 keV photons the angular dependence of the efficiency was also measured. The results have demonstrated that this diode is appro- priate for direct detection of low energy electromagnetic radiation. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189499
Volume :
54
Issue :
1
Database :
Academic Search Index
Journal :
IEEE Transactions on Nuclear Science
Publication Type :
Academic Journal
Accession number :
24136509
Full Text :
https://doi.org/10.1109/TNS.2006.887856