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Analysis for crystal structure of Bi(Fe,Sc)O3 thin films and their electrical properties.

Authors :
Yasui, Shintaro
Uchida, Hiroshi
Nakaki, Hiroshi
Nishida, Ken
Funakubo, Hiroshi
Koda, Seiichiro
Source :
Applied Physics Letters. 7/9/2007, Vol. 91 Issue 2, p022906. 3p. 5 Graphs.
Publication Year :
2007

Abstract

Thin films of Bi(Fe1-xScx)O3 (BFSO) system were fabricated on (111)Pt/TiO2/SiO2/(100)Si substrates by chemical solution deposition to improve the electrical resistivity by substituting electrically unstable Fe3+ cations for stable Sc3+ cations. A single phase of perovskite was obtained in the range of x=0–0.30, in which selective replacement of Fe3+ and Sc3+ was confirmed in x=0–0.15 by using Raman measurement. The leakage current density of the BFSO films was reduced by increasing x. A well-saturated polarization–electric field hysteresis loop was obtained for BFSO films with x=0.15, showing remanent polarization of approximately 35 μC/cm2. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
91
Issue :
2
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
25857944
Full Text :
https://doi.org/10.1063/1.2756356