A model for the polarization hysteresis loops of the perovskite-type ferroelectric thin films.

A model has been developed for the P-E hysteresis behavior from the perspective of dipole switching. Hysteresis loops have been reproduced with the model to agree reasonably well with the experimental data measured from various ferroelectric thin films. The model can also predict asymmetric hysteresis loop measured under unconventional situation. Additionally, the mathematical description can be easily combined with electronic design automation software in circuit simulation of ferroelectric capacitor or ferroelectric field effect transistor. [ABSTRACT FROM AUTHOR]