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Evaluation of a Capacitance Scaling System.

Authors :
Avramov-Zamurovic, Svetlana
Koffman, Andrew D.
Waltrip, Bryan Cristopher
Yicheng Wang
Source :
IEEE Transactions on Instrumentation & Measurement. Dec2007, Vol. 56 Issue 6, p2160-2163. 4p. 2 Charts.
Publication Year :
2007

Abstract

An improved error analysis of an existing capacitance scaling system for supporting measurements of higher valued (10 nF to 100 μF) ceramic-dielectric four-terminal-pair (4TP) capacitance standards over the 100-Hz to 100-kHz frequency range is described. The capacitance scaling system uses a commercial impedance (inductance-capacitance-resistance) meter and a single-decade inductive voltage divider as an impedance comparator. Four-terminal-pair capacitors in decade (10: 1) steps from 10 nF to 100 F are measured. The system's 10:1 scaling error is determined using 100-pF and 1-nF air-dielectric 4TP capacitance standards with known capacitance and loss characteristics over frequency. This paper discusses the significant reductions in measurement uncertainty that were attained through the use of improved calibration standards and measurement method refinements. Details of the uncertainty analysis for a 10-nF capacitor (in the 100-Hz to 10-kHz frequency range) and verification data are presented. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189456
Volume :
56
Issue :
6
Database :
Academic Search Index
Journal :
IEEE Transactions on Instrumentation & Measurement
Publication Type :
Academic Journal
Accession number :
28016354
Full Text :
https://doi.org/10.1109/TIM.2007.908318