Cite
Theoretical investigation on force sensitivity in Q-controlled phase-modulation atomic force microscopy in constant-amplitude mode.
MLA
Kobayashi, Naritaka, et al. “Theoretical Investigation on Force Sensitivity in Q-Controlled Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode.” Journal of Applied Physics, vol. 103, no. 5, Mar. 2008, p. 054305. EBSCOhost, https://doi.org/10.1063/1.2890380.
APA
Kobayashi, N., Yan Jun Li, Naitoh, Y., Kageshima, M., & Sugawara, Y. (2008). Theoretical investigation on force sensitivity in Q-controlled phase-modulation atomic force microscopy in constant-amplitude mode. Journal of Applied Physics, 103(5), 054305. https://doi.org/10.1063/1.2890380
Chicago
Kobayashi, Naritaka, Yan Jun Li, Yoshitaka Naitoh, Masami Kageshima, and Yasuhiro Sugawara. 2008. “Theoretical Investigation on Force Sensitivity in Q-Controlled Phase-Modulation Atomic Force Microscopy in Constant-Amplitude Mode.” Journal of Applied Physics 103 (5): 054305. doi:10.1063/1.2890380.