Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation.

The authors have developed phase modulation atomic force microscopy in constant excitation mode capable of simultaneously imaging the topography and energy dissipation of a sample surface in a liquid. This setup utilizes a fast, low-cost sample-and-hold technique to analyze the oscillation signals of a cantilever. The proposed circuitry allows us to measure the local energy dissipated by the tip-sample interaction during imaging. The energy dissipation image exhibits a material-specific contrast for a polymer-blend film. [ABSTRACT FROM AUTHOR]