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Phase modulation atomic force microscopy in constant excitation mode capable of simultaneous imaging of topography and energy dissipation.
- Source :
-
Applied Physics Letters . 3/24/2008, Vol. 92 Issue 12, p121903. 3p. 1 Color Photograph, 1 Diagram. - Publication Year :
- 2008
-
Abstract
- The authors have developed phase modulation atomic force microscopy in constant excitation mode capable of simultaneously imaging the topography and energy dissipation of a sample surface in a liquid. This setup utilizes a fast, low-cost sample-and-hold technique to analyze the oscillation signals of a cantilever. The proposed circuitry allows us to measure the local energy dissipated by the tip-sample interaction during imaging. The energy dissipation image exhibits a material-specific contrast for a polymer-blend film. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00036951
- Volume :
- 92
- Issue :
- 12
- Database :
- Academic Search Index
- Journal :
- Applied Physics Letters
- Publication Type :
- Academic Journal
- Accession number :
- 31554182
- Full Text :
- https://doi.org/10.1063/1.2901151