MEASURING S-PARAMETERS: THE FIRST 50 YEARS.

The article focuses on the 50-year evolution and the visibility of the test equipment and scattering parameters or S-parameters for characterizing radio frequency (RF) microwave behavior. It stated that the emergence of vector network analyzers and S-parameters measurements are important to the engineers to design with newly available high frequency semi-conductors that were performed using test systems implemented with rudimentary signal generators, power detectors and impedance bridges. Moreover, the network analyzer measures the attributes of new devices and materials to address the needs of new applications, operating conditions, and parametric analyses.