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Simulating X-ray diffraction of textured films.
- Source :
-
Journal of Applied Crystallography . Apr2008, Vol. 41 Issue 2, p262-271. 10p. 5 Color Photographs, 6 Diagrams, 1 Chart, 2 Graphs. - Publication Year :
- 2008
-
Abstract
- Computationally efficient simulations of grazing-incidence X-ray diffraction (GIXD) are discussed, with particular attention given to textured thin polycrystalline films on supporting substrates. A computer program has been developed for simulating scattering from thin films exhibiting varying degrees of preferred orientation. One emphasized common case is that of a `fibre' symmetry axis perpendicular to the sample plane, resulting from crystallites having one well defined crystal facet towards the substrate, but no preferred in- plane orientation. Peak splitting caused by additional scattering from the totally substrate-reflected beam (two-beam approximation) and refraction effects are also included in the program, together with the geometrical intensity corrections associated with GIXD measurements. To achieve `user friendliness' for scientists less familiar with diffraction, the mathematically simplest possible descriptions are sought whenever feasible. The practical use of the program is demonstrated for a selected thin-film example, perylene, which is of relevance for organic electronics. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218898
- Volume :
- 41
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Crystallography
- Publication Type :
- Academic Journal
- Accession number :
- 32037310
- Full Text :
- https://doi.org/10.1107/S0021889808001064