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High-performance AlGaN/GaN lateral field-effect rectifiers compatible with high electron mobility transistors.

Authors :
Chen, Wanjun
Wong, King-Yuen
Huang, Wei
Chen, Kevin J.
Source :
Applied Physics Letters. 6/23/2008, Vol. 92 Issue 25, p253501. 3p. 1 Diagram, 4 Graphs.
Publication Year :
2008

Abstract

A high electron mobility transistor (HEMT)-compatible power lateral field-effect rectifier (L-FER) with low turn-on voltage is demonstrated using the same fabrication process as that for normally off AlGaN/GaN HEMT, providing a low-cost solution for GaN power integrated circuits. The power rectifier features a Schottky-gate-controlled two-dimensional electron gas channel between the cathode and anode. By tying up the Schottky gate and anode together, the forward turn-on voltage of the rectifier is determined by the threshold voltage of the channel instead of the Schottky barrier. The L-FER with a drift length of 10 μm features a forward turn-on voltage of 0.63 V at a current density of 100 A/cm2. This device also exhibits a reverse breakdown voltage (BV) of 390 V at a current level of 1 mA/mm and a specific on resistance (RON,sp) of 1.4 mΩ cm2, yielding a figure of merit (BV2/RON,sp) of 108 MW/cm2. The excellent device performance, coupled with the lateral device structure and process compatibility with AlGaN/GaN HEMT, make the proposed L-FER a promising candidate for GaN power integrated circuits. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
92
Issue :
25
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
32990971
Full Text :
https://doi.org/10.1063/1.2951615