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Corrugated quantum well infrared photodetectors for material characterization.

Authors :
Choi, K. K.
Chen, C. J.
Tsui, D. C.
Source :
Journal of Applied Physics. 8/1/2000, Vol. 88 Issue 3, p1612. 12p. 1 Diagram, 16 Graphs.
Publication Year :
2000

Abstract

Discusses the utilities of corrugated quantum well infrared photodetectors (QWIP) in detector material characterization. Capability of the characterization technique of providing accurate and detailed information on the intrinsic properties of QWIP materials under actual operating conditions.

Subjects

Subjects :
*QUANTUM wells
*INFRARED detectors

Details

Language :
English
ISSN :
00218979
Volume :
88
Issue :
3
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
3397413
Full Text :
https://doi.org/10.1063/1.373862
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