Cite
Evaluation of Generalized LFSRs as Test Pattern Generators in Two-Dimensional Scan Designs.
MLA
Kakade, Jayawant, et al. “Evaluation of Generalized LFSRs as Test Pattern Generators in Two-Dimensional Scan Designs.” IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 27, no. 9, Sept. 2008, pp. 1689–92. EBSCOhost, https://doi.org/10.1109/TCAD.2008.927763.
APA
Kakade, J., Kagaris, D., & Pradhan, D. K. (2008). Evaluation of Generalized LFSRs as Test Pattern Generators in Two-Dimensional Scan Designs. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 27(9), 1689–1692. https://doi.org/10.1109/TCAD.2008.927763
Chicago
Kakade, Jayawant, Dimitri Kagaris, and Dhiraj K. Pradhan. 2008. “Evaluation of Generalized LFSRs as Test Pattern Generators in Two-Dimensional Scan Designs.” IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 27 (9): 1689–92. doi:10.1109/TCAD.2008.927763.