MOSFET Degradation Under RF Stress.

MLA

Sasse, Guido T., et al. “MOSFET Degradation Under RF Stress.” IEEE Transactions on Electron Devices, vol. 55, no. 11, Nov. 2008, pp. 3167–74. EBSCOhost, https://doi.org/10.1109/TED.2008.2004650.

APA

Sasse, G. T., Kuper, F. G., & Schmitz, J. (2008). MOSFET Degradation Under RF Stress. IEEE Transactions on Electron Devices, 55(11), 3167–3174. https://doi.org/10.1109/TED.2008.2004650

Chicago

Sasse, Guido T., Fred G. Kuper, and Jurriaan Schmitz. 2008. “MOSFET Degradation Under RF Stress.” IEEE Transactions on Electron Devices 55 (11): 3167–74. doi:10.1109/TED.2008.2004650.