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Precise determination of elastic constants by high-resolution inelastic X-ray scattering.

Authors :
Fukui, Hiroshi
Katsura, Tomoo
Kuribayashi, Takahiro
Matsuzaki, Takuya
Yoneda, Akira
Ito, Eiji
Kudoh, Yasuhiro
Tsutsui, Satoshi
Baron, Alfred Q. R.
Source :
Journal of Synchrotron Radiation. Nov2008, Vol. 15 Issue 6, p618-623. 6p. 1 Chart, 22 Graphs.
Publication Year :
2008

Abstract

Inelastic X-ray scattering (IXS) measurements have been performed on an MgO single crystal in order to evaluate IXS as a methodology for accurate and precise determination of elastic constants and sound velocities. By performing the IXS experiment using a 12-analyzer array, the complete set of single-crystal elastic constants of MgO were determined to a precision better than 0.8% (sound velocities to better than 0.2%). The results are consistent with values in the literature. The precision and accuracy of this work, which is significantly better than other published work to date, demonstrates the potential of IXS in determining elastic properties. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09090495
Volume :
15
Issue :
6
Database :
Academic Search Index
Journal :
Journal of Synchrotron Radiation
Publication Type :
Academic Journal
Accession number :
35564824
Full Text :
https://doi.org/10.1107/S0909049508023248