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Architecture drives test system standards.

Authors :
Mueller, Joe
Oblad, Roger
Source :
IEEE Spectrum. Sep2000, Vol. 37 Issue 9, p68. 6p. 1 Color Photograph.
Publication Year :
2000

Abstract

Discusses the application of instrument drivers in building automated test and measurement systems. Advantages of instrument drivers; Interface bus used in instrument drivers; Functions used in controlling an instrument.

Details

Language :
English
ISSN :
00189235
Volume :
37
Issue :
9
Database :
Academic Search Index
Journal :
IEEE Spectrum
Publication Type :
Periodical
Accession number :
3586608
Full Text :
https://doi.org/10.1109/6.866287