Studies of the Individual and Combined Effects of VUV Radiation and Hyperthermal O or Ar Atoms on FEP Teflon® and PMMA Surfaces.

Atomic oxygen and molecular nitrogen are the major constituents in the residual atmosphere at low Earth orbital altitudes, and they collide with spacecraft surfaces at relative velocities of ∼7.8 km s-1. The energy associated with these hyperthermal collisions is in excess of many bond dissociation energies and may help promote materials degradation by allowing barriers to reaction or to collision-induced dissociation (CID) to be overcome. Spacecraft in low Earth orbit (LEO) are also exposed to high fluxes of vacuum ultraviolet (VUV) radiation, which may degrade materials through various photochemical mechanisms. Fluorinated ethylene-propylene copolymer (FEP Teflon®) is commonly used on spacecraft. Many researchers have studied the individual and/or combined effects of atomic oxygen, VUV light, and CID on FEP Teflon®, yet the detailed degradation mechanisms of FEP Teflon® in LEO are still a subject of debate. Although not as ubiquitous as a spacecraft material, polymethylmethacrylate (PMMA) has been studied as a model and control polymer because of its well known propensity to “unzip” upon exposure to VUV radiation. A combination of beam-surface scattering, quartz crystal microbalance (QCM), and surface-recession experiments were conducted to study the effects of various combinations of O atoms (in the ground O(3P) state), Ar atoms, and VUV light on FEP Teflon® and PMMA. A laser-breakdown source was used to create hyperthermal beams containing O and O2 or argon. A deuterium lamp provided a source of VUV light. O atoms with 4 eV of translational energy or less did not react with a pristine FEP Teflon® surface. Volatile O-containing reaction products were observed when the O-atom energy was higher than 4.5 eV, and the signal increased with O-atom energy. Significant FEP Teflon erosion (∼20% of Kapton® H) was observed when it was exposed to the hyperthermal O/O2 beam with an average O-atom energy of 5.4 eV. FEP Teflon® and PMMA that were exposed to VUV light alone yielded volatile products and mass loss. Similarly, CID by Ar also yielded volatile products and mass loss, when the Ar energy was higher than 8 eV. However, the erosion caused by VUV light and/or CID is not significant compared to that caused by O/O2. There were no observed synergistic effects of VUV light and O/O2 exposure. [ABSTRACT FROM AUTHOR]