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Electrical transport and structural study of CuCr1− x Mg x O2 delafossite thin films grown by pulsed laser deposition

Authors :
Sadik, P.W.
Ivill, M.
Craciun, V.
Norton, D.P.
Source :
Thin Solid Films. Apr2009, Vol. 517 Issue 11, p3211-3215. 5p.
Publication Year :
2009

Abstract

Abstract: The growth and properties of delafossites CuCr1− x Mg x O2 thin films are examined. These films are grown by pulsed laser deposition. As a class of materials delafossites have received recent interest since some members show p-type behavior. While not considered true wide-bandgap materials due to a narrow indirect bandgap that fails to adsorb light due to a forbidden same parity transition, optical transparencies greater than 40% in the visible can be observed. In order to be useful for transparent device applications, CuCr1− x Mg x O2 films are needed with low resistivity and high optical transparency. Epitaxial films of CuCr1− x Mg x O2 were grown on c-sapphire, examining the effects of oxygen pressure and growth temperature on film properties. Films were realized with resistivity of ~0.02 Ω-cm and optical transparency of 40% in the visible. The formation of a problematic secondary minority spinel phase of (Cu,Mg)Cr2O4 is discussed. While conductivity increases substantially with Mg doping, the incidence of the spinel phase increases as well. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00406090
Volume :
517
Issue :
11
Database :
Academic Search Index
Journal :
Thin Solid Films
Publication Type :
Academic Journal
Accession number :
37227455
Full Text :
https://doi.org/10.1016/j.tsf.2008.10.097