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Electrical transport and structural study of CuCr1− x Mg x O2 delafossite thin films grown by pulsed laser deposition
- Source :
-
Thin Solid Films . Apr2009, Vol. 517 Issue 11, p3211-3215. 5p. - Publication Year :
- 2009
-
Abstract
- Abstract: The growth and properties of delafossites CuCr1− x Mg x O2 thin films are examined. These films are grown by pulsed laser deposition. As a class of materials delafossites have received recent interest since some members show p-type behavior. While not considered true wide-bandgap materials due to a narrow indirect bandgap that fails to adsorb light due to a forbidden same parity transition, optical transparencies greater than 40% in the visible can be observed. In order to be useful for transparent device applications, CuCr1− x Mg x O2 films are needed with low resistivity and high optical transparency. Epitaxial films of CuCr1− x Mg x O2 were grown on c-sapphire, examining the effects of oxygen pressure and growth temperature on film properties. Films were realized with resistivity of ~0.02 Ω-cm and optical transparency of 40% in the visible. The formation of a problematic secondary minority spinel phase of (Cu,Mg)Cr2O4 is discussed. While conductivity increases substantially with Mg doping, the incidence of the spinel phase increases as well. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00406090
- Volume :
- 517
- Issue :
- 11
- Database :
- Academic Search Index
- Journal :
- Thin Solid Films
- Publication Type :
- Academic Journal
- Accession number :
- 37227455
- Full Text :
- https://doi.org/10.1016/j.tsf.2008.10.097