Cite
p- and n-Type Ba8Ga16Ge30 studied by X-ray photoelectron spectroscopy
MLA
Tang, Jun, et al. “P- and n-Type Ba8Ga16Ge30 Studied by X-Ray Photoelectron Spectroscopy.” Chemical Physics Letters, vol. 472, no. 1–3, Apr. 2009, pp. 60–64. EBSCOhost, https://doi.org/10.1016/j.cplett.2009.02.061.
APA
Tang, J., Kumashiro, R., Ju, J., Li, Z., Avila, M. A., Suekuni, K., Takabatake, T., Guo, F., Kobayashi, K., & Tanigaki, K. (2009). p- and n-Type Ba8Ga16Ge30 studied by X-ray photoelectron spectroscopy. Chemical Physics Letters, 472(1–3), 60–64. https://doi.org/10.1016/j.cplett.2009.02.061
Chicago
Tang, Jun, Ryotaro Kumashiro, Jing Ju, Zhaofei Li, Marcos A. Avila, Kouichirou Suekuni, Toshiro Takabatake, Fangzhun Guo, Keisuke Kobayashi, and Katsumi Tanigaki. 2009. “P- and n-Type Ba8Ga16Ge30 Studied by X-Ray Photoelectron Spectroscopy.” Chemical Physics Letters 472 (1–3): 60–64. doi:10.1016/j.cplett.2009.02.061.