Back to Search Start Over

Electron-carrier generation by edge dislocations in InN films: First-principles study

Authors :
Takei, Y.
Nakayama, T.
Source :
Journal of Crystal Growth. May2009, Vol. 311 Issue 10, p2767-2771. 5p.
Publication Year :
2009

Abstract

Abstract: Electronic structures of edge dislocations in InN films are studied using the first-principles calculation. We found that dangling-bond states of In atoms localized in the dislocation core are located above the conduction-band bottom and thus supplies the electron carriers to the conduction band of bulk InN, in agreement with the experimental suggestion by Wang et al. [Appl. Phys. Lett. 90 (2007) 151901]. Moreover, it is shown that the Fermi energy in the conduction band has the tendency to be pinned at the energy positions of N-related dangling-bond states. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00220248
Volume :
311
Issue :
10
Database :
Academic Search Index
Journal :
Journal of Crystal Growth
Publication Type :
Academic Journal
Accession number :
40637196
Full Text :
https://doi.org/10.1016/j.jcrysgro.2009.01.019