Measuring voltage transients with an ultrafast scanning tunneling microscope.

MLA

Keil, Ulrich D., and Jacob R. Jensen. “Measuring Voltage Transients with an Ultrafast Scanning Tunneling Microscope.” Applied Physics Letters, vol. 70, no. 19, May 1997, p. 2625. EBSCOhost, https://doi.org/10.1063/1.118938.

APA

Keil, U. D., & Jensen, J. R. (1997). Measuring voltage transients with an ultrafast scanning tunneling microscope. Applied Physics Letters, 70(19), 2625. https://doi.org/10.1063/1.118938

Chicago

Keil, Ulrich D., and Jacob R. Jensen. 1997. “Measuring Voltage Transients with an Ultrafast Scanning Tunneling Microscope.” Applied Physics Letters 70 (19): 2625. doi:10.1063/1.118938.