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On-Die Power Supply Noise Measurement Techniques.
- Source :
-
IEEE Transactions on Advanced Packaging . May2009, Vol. 32 Issue 2, p248-259. 12p. 5 Black and White Photographs, 5 Diagrams, 16 Graphs. - Publication Year :
- 2009
-
Abstract
- This paper presents techniques for characterizing wide-band on-chip power supply noise using only two on-chip low-throughput samplers. The properties of supply noise and their associated measurement techniques are reviewed to show how this can be achieved. An initial design of the samplers uses high-resolution VCO-based analog-to-digital converters, and experimental results from a test-chip verify the efficacy of the measurement techniques. To enable simple sampler designs to be used even in aggressively scaled process technologies, measurement systems based on dithered low-resolution samplers are also developed and experimentally characterized. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 15213323
- Volume :
- 32
- Issue :
- 2
- Database :
- Academic Search Index
- Journal :
- IEEE Transactions on Advanced Packaging
- Publication Type :
- Academic Journal
- Accession number :
- 42011795
- Full Text :
- https://doi.org/10.1109/TADVP.2009.2012521