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Bright-line defect formation in silicon carbide injection diodes.

Authors :
Konstantinov, A.O.
Bleichner, H.
Source :
Applied Physics Letters. 12/22/1997, Vol. 71 Issue 25, p3700. 3p. 7 Black and White Photographs, 1 Diagram, 1 Graph.
Publication Year :
1997

Abstract

Investigates the irreversible formation of a network of linear defects in silicon carbide injection diodes. Relation of the defects to dislocations; Result of the thermal stress near the tip of the contact probe; Effect of higher forward currents.

Subjects

Subjects :
*DIODES
*SILICON carbide

Details

Language :
English
ISSN :
00036951
Volume :
71
Issue :
25
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4255241
Full Text :
https://doi.org/10.1063/1.120486
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