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Ellipsometric monitoring of an oriented diamond nucleation process in bias-enhanced chemical....

Authors :
Hayashi, Yasuaki
Xi Li
Source :
Applied Physics Letters. 11/17/1997, Vol. 71 Issue 20, p2913. 3p. 1 Diagram, 3 Graphs.
Publication Year :
1997

Abstract

Analyzes the process of bias-enhanced nucleation of diamond through ellipsometry. Determination of the time evolution of optically equivalent thickness; Confirmation of the existence of several stages of the process; Result of accelerated elimination of weak carbon-carbon bonds.

Details

Language :
English
ISSN :
00036951
Volume :
71
Issue :
20
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4272606
Full Text :
https://doi.org/10.1063/1.120214