Cite
A Generic Data-Driven Nonparametric Framework for Variability Analysis of Integrated Circuits in Nanometer Technologies.
MLA
Mukhopadhyay, Saibal. “A Generic Data-Driven Nonparametric Framework for Variability Analysis of Integrated Circuits in Nanometer Technologies.” IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, vol. 28, no. 7, July 2009, pp. 1038–46. EBSCOhost, https://doi.org/10.1109/TCAD.2009.2017429.
APA
Mukhopadhyay, S. (2009). A Generic Data-Driven Nonparametric Framework for Variability Analysis of Integrated Circuits in Nanometer Technologies. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems, 28(7), 1038–1046. https://doi.org/10.1109/TCAD.2009.2017429
Chicago
Mukhopadhyay, Saibal. 2009. “A Generic Data-Driven Nonparametric Framework for Variability Analysis of Integrated Circuits in Nanometer Technologies.” IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems 28 (7): 1038–46. doi:10.1109/TCAD.2009.2017429.