Specular x-ray reflectivity studies of microstructure and ordering in self-assembled multilayers.

Reports on the use of specular x-ray reflectivity to probe the structures of self-assembled monolayers and multilayers deposited using a three-step siloxane self-assembly technique that is repeated to form periodic multilayers. Increase in the film thickness as a function of the number of trilayers; Bragg peaks corresponding to the inter-trilayer spacing.