Cite
Modeling of Set/Reset Operations in NiO-Based Resistive-Switching Memory Devices.
MLA
Cagli, Carlo, et al. “Modeling of Set/Reset Operations in NiO-Based Resistive-Switching Memory Devices.” IEEE Transactions on Electron Devices, vol. 56, no. 8, Aug. 2009, pp. 1712–20. EBSCOhost, https://doi.org/10.1109/TED.2009.2024046.
APA
Cagli, C., Nardi, F., & Ielmini, D. (2009). Modeling of Set/Reset Operations in NiO-Based Resistive-Switching Memory Devices. IEEE Transactions on Electron Devices, 56(8), 1712–1720. https://doi.org/10.1109/TED.2009.2024046
Chicago
Cagli, Carlo, Federico Nardi, and Daniele Ielmini. 2009. “Modeling of Set/Reset Operations in NiO-Based Resistive-Switching Memory Devices.” IEEE Transactions on Electron Devices 56 (8): 1712–20. doi:10.1109/TED.2009.2024046.