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Ultralow noise field-effect transistor from multilayer graphene.

Authors :
Pal, Atindra Nath
Ghosh, Arindam
Source :
Applied Physics Letters. 8/24/2009, Vol. 95 Issue 8, p082105. 3p. 3 Graphs.
Publication Year :
2009

Abstract

We present low-frequency electrical resistance fluctuations, or noise, in graphene-based field-effect devices with varying number of layers. In single-layer devices, the noise magnitude decreases with increasing carrier density, which behaved oppositely in the devices with two or larger number of layers accompanied by a suppression in noise magnitude by more than two orders in the latter case. This behavior can be explained from the influence of external electric field on graphene band structure, and provides a simple transport-based route to isolate single-layer graphene devices from those with multiple layers. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
95
Issue :
8
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
43944888
Full Text :
https://doi.org/10.1063/1.3206658