Effect of annealing on electrical and structural properties of LaNiO3− δ thin films

MLA

Mickevičius, S., et al. “Effect of Annealing on Electrical and Structural Properties of LaNiO3−δ Thin Films.” Radiation Physics & Chemistry, vol. 78, no. 10, Oct. 2009, pp. S29–33. EBSCOhost, https://doi.org/10.1016/j.radphyschem.2009.05.016.

APA

Mickevičius, S., Grebinskij, S., Bondarenka, V., Tvardauskas, H., Senulis, M., Lisauskas, V., Šliužienė, K., Vengalis, B., & Orlowski, B. A. (2009). Effect of annealing on electrical and structural properties of LaNiO3−δ thin films. Radiation Physics & Chemistry, 78(10), S29–S33. https://doi.org/10.1016/j.radphyschem.2009.05.016

Chicago

Mickevičius, S., S. Grebinskij, V. Bondarenka, H. Tvardauskas, M. Senulis, V. Lisauskas, K. Šliužienė, B. Vengalis, and B.A. Orlowski. 2009. “Effect of Annealing on Electrical and Structural Properties of LaNiO3−δ Thin Films.” Radiation Physics & Chemistry 78 (10): S29–33. doi:10.1016/j.radphyschem.2009.05.016.