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High coercivity in SiO[sub 2]-doped CoFe[sub 2]O[sub 4] powders and thin films.

Authors :
Ding, J.
Chen, Y. J.
Chen, Y.J.
Shi, Y.
Wang, S.
Source :
Applied Physics Letters. 11/27/2000, Vol. 77 Issue 22.
Publication Year :
2000

Abstract

Mo¨ssbauer and magnetic studies have shown that 1-2 wt % of SiO[sub 2] could be dissolved in the CoFe[sub 2]O[sub 4] structure. Changes in magnetization and Curie temperature were observed. The presence of SiO[sub 2] might enhance magnetic anisotropy. Coercivity values of up to 3.5 kOe were measured for mechanically alloyed CoFe[sub 2]O[sub 4]/SiO[sub 2] powders. High coercivities were also achieved in SiO[sub 2]-doped Co-ferrite thin films prepared by sputtering technique. The Co-ferrite thin film deposited on a silicon wafer using a 5 wt % SiO[sub 2]/Co-ferrite target possessed a coercivity of 7.4 kOe. Spring-magnet behavior was observed, indicating the possible presence of remanence enhancement due to exchange coupling because of nanocrystalline structure. © 2000 American Institute of Physics. [ABSTRACT FROM AUTHOR]

Subjects

Subjects :
*THIN films
*FERRITES

Details

Language :
English
ISSN :
00036951
Volume :
77
Issue :
22
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
4415060
Full Text :
https://doi.org/10.1063/1.1328374