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Transient-to-Digital Converter for System-Level Electrostatic Discharge Protection in CMOS ICs.

Authors :
Ming-Dou Ker
Cheng-Cheng Yen
Source :
IEEE Transactions on Electromagnetic Compatibility. Aug2009 Part 2 of 2, Vol. 51 Issue 3, p620-630. 11p.
Publication Year :
2009

Abstract

A new on-chip RC-based transient detection circuit for system-level electrostatic discharge (ESD) protection is proposed, which can detect fast electrical transients during the system-level ESD test. A novel on-chip transient-to-digital converter composed of four RC-based transient detection circuits and four different RC filter networks has been successfully designed and verified in a 0.18-μm CMOS process with 3.3-V devices. The output digital thermometer codes of the proposed on-chip transient-to-digital converter correspond to different ESD voltages under system-level ESD tests. The proposed on-chip transient-to-digital converter can be further combined with firmware cooperation to provide an effective solution to solve the system-level ESD protection issue in microelectronic systems equipped with CMOS ICs. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189375
Volume :
51
Issue :
3
Database :
Academic Search Index
Journal :
IEEE Transactions on Electromagnetic Compatibility
Publication Type :
Academic Journal
Accession number :
44223001
Full Text :
https://doi.org/10.1109/TEMC.2009.2018124