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Etching Effect of the Autocloning Structure Using Ion-Assisted Deposition.

Authors :
Yeh, Yu-Wen
Chang, Te-Hung
Chen, Sheng-Hui
Lee, Cheng-Chung
Source :
Optical Review. Mar/Apr2009, Vol. 16 Issue 2, p222-225. 4p. 1 Chart, 7 Graphs.
Publication Year :
2009

Abstract

The article presents a study that analyzes the effect of etching as well as redeposition effects with consideration on various etching times. The study was undertaken through simulating the surface evolution function patterned on the unified process model to analyze the etching effect. The findings showed that the simulation method generated good results in various etching times and the surface angular depends more on etching effect compared to redeposition effect.

Details

Language :
English
ISSN :
13406000
Volume :
16
Issue :
2
Database :
Academic Search Index
Journal :
Optical Review
Publication Type :
Academic Journal
Accession number :
44345014
Full Text :
https://doi.org/10.1007/s10043-009-0041-4