Cite
Measurement of mean and gradient residual stresses in thin films using spiral microstructures
MLA
Li, Chen-Jung. “Measurement of Mean and Gradient Residual Stresses in Thin Films Using Spiral Microstructures.” Sensors & Actuators A: Physical, vol. 155, no. 1, Oct. 2009, pp. 181–87. EBSCOhost, https://doi.org/10.1016/j.sna.2009.07.020.
APA
Li, C.-J. (2009). Measurement of mean and gradient residual stresses in thin films using spiral microstructures. Sensors & Actuators A: Physical, 155(1), 181–187. https://doi.org/10.1016/j.sna.2009.07.020
Chicago
Li, Chen-Jung. 2009. “Measurement of Mean and Gradient Residual Stresses in Thin Films Using Spiral Microstructures.” Sensors & Actuators A: Physical 155 (1): 181–87. doi:10.1016/j.sna.2009.07.020.