Cite
Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering.
MLA
Hong-Ji Chen, et al. “Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-Ray Scattering.” Journal of Physical Chemistry B, vol. 113, no. 38, Sept. 2009, pp. 12623–27. EBSCOhost, https://doi.org/10.1021/jp905457b.
APA
Hong-Ji Chen, Sheng-Ying Li, Xiao-Jun Liu, Rui-Peng Li, Detlef-M. Smilgies, Zhong-Hua Wu, & Zhihong Li. (2009). Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering. Journal of Physical Chemistry B, 113(38), 12623–12627. https://doi.org/10.1021/jp905457b
Chicago
Hong-Ji Chen, Sheng-Ying Li, Xiao-Jun Liu, Rui-Peng Li, Detlef-M. Smilgies, Zhong-Hua Wu, and Zhihong Li. 2009. “Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-Ray Scattering.” Journal of Physical Chemistry B 113 (38): 12623–27. doi:10.1021/jp905457b.