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A new compact model for external latchup
- Source :
-
Microelectronics Reliability . Dec2009, Vol. 49 Issue 12, p1447-1454. 8p. - Publication Year :
- 2009
-
Abstract
- Abstract: A model is presented for external latchup. The effects of spacing, temperature, supply voltage and layout are captured in the model. The model shows a good fit to measurement results from two different technologies, RF-CMOS and SmartMOS. [Copyright &y& Elsevier]
Details
- Language :
- English
- ISSN :
- 00262714
- Volume :
- 49
- Issue :
- 12
- Database :
- Academic Search Index
- Journal :
- Microelectronics Reliability
- Publication Type :
- Academic Journal
- Accession number :
- 45557823
- Full Text :
- https://doi.org/10.1016/j.microrel.2008.12.003